Abstract:
In this work, a new methodology for rendering profiles of etched nuclear tracks is presented, using confocal micro-Raman spectrometry instrumentation. The precise profile of etched nuclear tracks with normal and/or angular incidence of the particle can be determined in few minutes, with a great visual and numerical resolution, that means a quantitative and qualitative simultaneous chemical and morphology characterization with the Raman technique. The Raman image routine is designed to acquire at each image pixel a complete Raman spectrum. This is a mapping of the functional groups that form the polymeric structure, which may be broken by the damage caused by the incident radiation and/or the etching process.
