Medina, N. H.; Aguiar, V. A. P.; Added, N.; Aguirre, F.; Macchione, E. L. A; Alberton, S. G.; Silveira, M. A. G.; Benfica, J.; Vargas, F.; Porcher, B.
 (2016-08-08)
Experimental setups are being prepared to test and to qualify electronic devices regarding their tolerance to Single Event Effect (SEE). A multiple test setup and a new beam line developed especially for SEE studies at the ...